The X-ray thickness gauge / basis weight gauge utilizes the principle that when X-rays penetrate the measured material, the change in X-ray intensity is related to the material's thickness, thereby measuring the material's thickness (basis weight). It is a non-contact dynamic measuring instrument. Featuring an embedded core control unit and an industrial control computer (IPC) as its core, it collects and calculates data, outputs target deviation values to the thickness (basis weight) control system, and calculates the thickness (basis weight) of the measured material.